BO-Related Defects : Overcoming Bulk Lifetime Degradation in Crystalline Si by Regeneration

Hahn, Giso; Wilking, Svenja; Herguth, Axel

BO-Related Defects : Overcoming Bulk Lifetime Degradation in Crystalline Si by Regeneration

Dateien

Hahn_0-322951.pdfGröße: 1.97 MBDownloads: 563

Datum

2016

Open Access-Veröffentlichung

Open Access Green

Sammlungen

Physik

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Solid State Phenomena. 2016, 242, pp. 80-89. ISSN 0377-6883. eISSN 1662-9779. Available under: doi: 10.4028/www.scientific.net/SSP.242.80

Zusammenfassung

Boron-oxygen related defects formed under working conditions of a c-Si solar cell can be a showstopper for new cell concepts enabling higher conversion efficiencies. The recombination activity of these defects can be reduced to negligible values by a regeneration process under elevated temperatures and in the presence of excess charge carriers in the Si bulk. It is shown that this process also relies on the presence of H in the c-Si bulk. Regeneration kinetics can be sped up by higher temperatures, higher concentrations of excess charge carriers and higher H concentration in the c-Si bulk. But care has to be taken to avoid a destabilization reaction taking place at higher temperature, resulting in the BO-related defects being again present in the recombination-active state. A 3-state model with the corresponding reaction rates between the different defects states describes the experimental findings and can be used for predictions of an optimized regeneration process.

Fachgebiet (DDC)

530 Physik

Schlagwörter

crystalline Si, solar cell, boron-oxygen, defect, regeneration, hydrogen

Zitieren

ISO 690

HAHN, Giso, Svenja WILKING, Axel HERGUTH, 2016. BO-Related Defects : Overcoming Bulk Lifetime Degradation in Crystalline Si by Regeneration. In: Solid State Phenomena. 2016, 242, pp. 80-89. ISSN 0377-6883. eISSN 1662-9779. Available under: doi: 10.4028/www.scientific.net/SSP.242.80

BibTex

@article{Hahn2016BORel-33190,
  year={2016},
  doi={10.4028/www.scientific.net/SSP.242.80},
  title={BO-Related Defects : Overcoming Bulk Lifetime Degradation in Crystalline Si by Regeneration},
  volume={242},
  issn={0377-6883},
  journal={Solid State Phenomena},
  pages={80--89},
  author={Hahn, Giso and Wilking, Svenja and Herguth, Axel}
}

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