@inproceedings{Merhof2010-10Analy-18653,
  year={2010},
  doi={10.1109/NSSMIC.2010.5874202},
  title={Analysis of asymmetries in ictal and inter-ictal SPECT images for the localization of epileptic foci},
  isbn={978-1-4244-9106-3},
  publisher={IEEE},
  booktitle={IEEE Nuclear Science Symposuim & Medical Imaging Conference},
  pages={2338--2341},
  author={Merhof, Dorit and Mathers, Christian and Wright, Thomas and Kuwert, Torsten and Platsch, Günther}
}

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    <dc:creator>Mathers, Christian</dc:creator>
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    <dcterms:abstract xml:lang="eng">In patients suffering from focal epilepsy, the region of seizure onset is characterized by hyperperfusion during the seizure (ictal state), and hypoperfusion in normal (inter-ictal) state. For diagnosis and surgery planning in epilepsy patients, ictal and inter-ictal SPECT images play a major role. However, comparison of this kind of data is a difficult clinical problem due to varying physiological uptake in brain regions. For this reason, different analysis methods such as standard reading by a clinical expert, comparison to a normal database, subtraction ictal SPECT co-registered to MRI (SISCOM) or asymmetry analysis are applied, for a comprehensive analysis of the data. The latter is usually hampered by functional and anatomical asymmetries which aggravate analysis. For this reason, a novel approach for asymmetry analysis is presented in this work, which overcomes the aforementioned limitations. The approach was successfully applied to SPECT datasets of 10 epilepsy patients.</dcterms:abstract>
    <dcterms:issued>2010-10</dcterms:issued>
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    <dc:contributor>Wright, Thomas</dc:contributor>
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    <dc:contributor>Merhof, Dorit</dc:contributor>
    <dc:creator>Merhof, Dorit</dc:creator>
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    <dc:creator>Platsch, Günther</dc:creator>
    <dcterms:title>Analysis of asymmetries in ictal and inter-ictal SPECT images for the localization of epileptic foci</dcterms:title>
    <dc:creator>Kuwert, Torsten</dc:creator>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-03-20T10:11:02Z</dcterms:available>
    <dc:creator>Wright, Thomas</dc:creator>
    <dcterms:bibliographicCitation>First publ. in: 2010 IEEE Nuclear Science Symposium conference record (NSS/MIC 2010) : [including the 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and the 17th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; Knoxville, Tennessee, USA, 30 October - 6 November 2010 / [sponsored by the Nuclear and Plasma Sciences Society of the Institute of Electrical and Electronic Engineers ...]. - Piscataway, NJ : IEEE, 2010. - S. 2338 - 2341. - ISBN 978-1-424-49106-3</dcterms:bibliographicCitation>
    <dc:contributor>Platsch, Günther</dc:contributor>
    <dc:contributor>Mathers, Christian</dc:contributor>
    <dc:language>eng</dc:language>
    <dc:contributor>Kuwert, Torsten</dc:contributor>
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