Attosecond metrology in a continuous-beam transmission electron microscope

Ryabov, Andrey; Thurner, Johannes W.; Nabben, David; Tsarev, Maxim V.; Baum, Peter

Attosecond metrology in a continuous-beam transmission electron microscope

Dateien

Ryabov_2-o7fy853ztil46.pdfGröße: 338.18 KBDownloads: 236

Datum

2020

Angaben zur Forschungsförderung

European Union (EU): 647771

Open Access-Veröffentlichung

Open Access Gold

Sammlungen

Physik

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Science Advances. American Association for the Advancement of Science (AAAS). 2020, 6(46), eabb1393. eISSN 2375-2548. Available under: doi: 10.1126/sciadv.abb1393

Zusammenfassung

Electron microscopy can visualize the structure of complex materials with atomic and subatomic resolution, but investigations of reaction dynamics and light-matter interaction call for time resolution as well, ideally on a level below the oscillation period of light. Here, we report the use of the optical cycles of a continuous-wave laser to bunch the electron beam inside a transmission electron microscope into electron pulses that are shorter than half a cycle of light. The pulses arrive at the target at almost the full average brightness of the electron source and in synchrony to the optical cycles, providing attosecond time resolution of spectroscopic features. The necessary modifications are simple and can turn almost any electron microscope into an attosecond instrument that may be useful for visualizing the inner workings of light-matter interaction on the basis of the atoms and the cycles of light.

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

RYABOV, Andrey, Johannes W. THURNER, David NABBEN, Maxim V. TSAREV, Peter BAUM, 2020. Attosecond metrology in a continuous-beam transmission electron microscope. In: Science Advances. American Association for the Advancement of Science (AAAS). 2020, 6(46), eabb1393. eISSN 2375-2548. Available under: doi: 10.1126/sciadv.abb1393

BibTex

@article{Ryabov2020-11-11Attos-51899,
  year={2020},
  doi={10.1126/sciadv.abb1393},
  title={Attosecond metrology in a continuous-beam transmission electron microscope},
  number={46},
  volume={6},
  journal={Science Advances},
  author={Ryabov, Andrey and Thurner, Johannes W. and Nabben, David and Tsarev, Maxim V. and Baum, Peter},
  note={Article Number: eabb1393}
}

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