Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers

Lade...
Vorschaubild
Dateien
Zuschlag_opus-104112.pdf
Zuschlag_opus-104112.pdfGröße: 265.77 KBDownloads: 65
Datum
2009
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Open Access Green
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Publikationstyp
Beitrag zu einem Konferenzband
Publikationsstatus
Published
Erschienen in
Proceedings of the 24th European Photovoltaic Solar Energy Conference. München: WIP - Wirtschaft und Infrastruktur, 2009, pp. 2152-2156. ISBN 3-936338-25-6. Available under: doi: 10.4229/24thEUPVSEC2009-2DV.1.46
Zusammenfassung

It is well known that gettering and passivation steps during solar cell processing enhance the minority charge carrier lifetime (here simply referred to as lifetime) in the silicon wafers. The purpose of this work is to study the influence of different solar cell processing steps on lifetime depending on the impurity level. Therefore neighboring wafers of standard multicrystalline as well as differently contaminated ingots were treated with various POCl3-diffusion and/or hydrogenation steps. The sequence of treatments is varied to check the effect of each processing step individually and to investigate if an individual processing step is less or more effective if another step was applied before. Afterwards these wafers were examined by microwave photoconductance decay measurements (μPCD). The gained results might be important for defect engineering and the development of an optimized solar cell process on cost effective and impurity-rich silicon material to reduce the detrimental impact of metal impurities on solar cell parameters.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
mc Si, Impurities, Gettering
Konferenz
24th European Photovoltaic Solar Energy, 21. Sep. 2009 - 25. Sep. 2009, Hamburg
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690ZUSCHLAG, Annika, Johannes JUNGE, Sven SEREN, Giso HAHN, 2009. Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers. 24th European Photovoltaic Solar Energy. Hamburg, 21. Sep. 2009 - 25. Sep. 2009. In: Proceedings of the 24th European Photovoltaic Solar Energy Conference. München: WIP - Wirtschaft und Infrastruktur, 2009, pp. 2152-2156. ISBN 3-936338-25-6. Available under: doi: 10.4229/24thEUPVSEC2009-2DV.1.46
BibTex
@inproceedings{Zuschlag2009Evalu-962,
  year={2009},
  doi={10.4229/24thEUPVSEC2009-2DV.1.46},
  title={Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers},
  isbn={3-936338-25-6},
  publisher={WIP - Wirtschaft und Infrastruktur},
  address={München},
  booktitle={Proceedings of the 24th European Photovoltaic Solar Energy Conference},
  pages={2152--2156},
  author={Zuschlag, Annika and Junge, Johannes and Seren, Sven and Hahn, Giso}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/962">
    <dc:contributor>Hahn, Giso</dc:contributor>
    <dc:contributor>Seren, Sven</dc:contributor>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/962/1/Zuschlag_opus-104112.pdf"/>
    <dc:contributor>Zuschlag, Annika</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:rights>terms-of-use</dc:rights>
    <dc:contributor>Junge, Johannes</dc:contributor>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:30Z</dcterms:available>
    <dcterms:issued>2009</dcterms:issued>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <dc:creator>Hahn, Giso</dc:creator>
    <dcterms:bibliographicCitation>First publ. in: Proceedings of the 24th European Photovoltaic Solar Energy Conference, September 2009, Hamburg. München : WIP - Wirtschaft und Infrastruktur, 2009, pp. 2152-2156</dcterms:bibliographicCitation>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/962/1/Zuschlag_opus-104112.pdf"/>
    <dcterms:title>Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers</dcterms:title>
    <dc:language>eng</dc:language>
    <dcterms:abstract xml:lang="eng">It is well known that gettering and passivation steps during solar cell processing enhance the minority charge carrier lifetime (here simply referred to as lifetime) in the silicon wafers. The purpose of this work is to study the influence of different solar cell processing steps on lifetime depending on the impurity level. Therefore neighboring wafers of standard multicrystalline as well as differently contaminated ingots were treated with various POCl3-diffusion and/or hydrogenation steps. The sequence of treatments is varied to check the effect of each processing step individually and to investigate if an individual processing step is less or more effective if another step was applied before. Afterwards these wafers were examined by microwave photoconductance decay measurements (μPCD). The gained results might be important for defect engineering and the development of an optimized solar cell process on cost effective and impurity-rich silicon material to reduce the detrimental impact of metal impurities on solar cell parameters.</dcterms:abstract>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/962"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:creator>Zuschlag, Annika</dc:creator>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:creator>Seren, Sven</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:30Z</dc:date>
    <dc:creator>Junge, Johannes</dc:creator>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen