@article{Kuhn1999Defec-5205,
  year={1999},
  doi={10.1109/77.784816},
  title={Defect visualization in large area YBCO thin films by magneto-optical scanning technique},
  number={2},
  volume={9},
  journal={IEEE Transactions on Applied Superconductivity},
  pages={1844--1847},
  author={Kuhn, Marcus and Schey, Bernd and Biegel, Wolfgang and Stritzker, Bernd and Eisenmenger, Johannes and Leiderer, Paul and Heismann, Björn and Krämer, H.-P. and Neumüller, H.-W.}
}

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    <dc:contributor>Eisenmenger, Johannes</dc:contributor>
    <dc:creator>Krämer, H.-P.</dc:creator>
    <dc:contributor>Biegel, Wolfgang</dc:contributor>
    <dc:creator>Neumüller, H.-W.</dc:creator>
    <dc:contributor>Krämer, H.-P.</dc:contributor>
    <dc:contributor>Stritzker, Bernd</dc:contributor>
    <dc:contributor>Heismann, Björn</dc:contributor>
    <dc:contributor>Neumüller, H.-W.</dc:contributor>
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    <dc:creator>Eisenmenger, Johannes</dc:creator>
    <dcterms:issued>1999</dcterms:issued>
    <dcterms:bibliographicCitation>First publ. in: IEEE Transactions on Applied Superconductivity 9 (1999), Issue 2, Part 2, pp. 1844-1847</dcterms:bibliographicCitation>
    <dc:creator>Heismann, Björn</dc:creator>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T14:54:00Z</dc:date>
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    <dc:creator>Schey, Bernd</dc:creator>
    <dc:contributor>Schey, Bernd</dc:contributor>
    <dc:creator>Kuhn, Marcus</dc:creator>
    <dc:creator>Leiderer, Paul</dc:creator>
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    <dcterms:title>Defect visualization in large area YBCO thin films by magneto-optical scanning technique</dcterms:title>
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    <dc:contributor>Leiderer, Paul</dc:contributor>
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    <dcterms:abstract xml:lang="eng">Flux penetration in large area YBCO thin films has heen studied by a magneto-optical scanning technique. With a new apparatus HTS films as large as 20 cm x 20 cm can be investigated by scanning the films through an inhomogeneous magnetic field. The apparatus has been built to realize an effective homogeneity control of the electrical properties of large area HTS thin films used for device fabrication. Magnetic flux penetration into YDCO thin films of different sizes and with intrinsic defects as well as artificial ones have been studied at 50 K. Magneto-optical measurements are compared with optical microscopy (OM) and inductive jc-characterizations. A correlation between-the kind of defect and its influence on the electrical properties has been studied with regard to device applications. YBCO films structured especially for high current applications were investigated magneto-optically. These results will be compared to optical photographs of the quenching process caused by currents I &gt; Ic.</dcterms:abstract>
    <dc:contributor>Kuhn, Marcus</dc:contributor>
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    <dc:creator>Stritzker, Bernd</dc:creator>
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