@article{Ochmann1999circu-9114,
  year={1999},
  doi={10.1063/1.1149709},
  title={A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale},
  number={4},
  volume={70},
  journal={Review of Scientific Instruments},
  pages={2049--2052},
  author={Ochmann, Michael and Münzer, Hans-Joachim and Boneberg, Johannes and Leiderer, Paul}
}

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    <dc:contributor>Boneberg, Johannes</dc:contributor>
    <dc:creator>Münzer, Hans-Joachim</dc:creator>
    <dc:contributor>Münzer, Hans-Joachim</dc:contributor>
    <dc:creator>Ochmann, Michael</dc:creator>
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    <dcterms:abstract xml:lang="eng">We demonstrate a new circuit design for fast measurements of the voltage drop across the gap of a scanning tunneling microscope (STM) based on the simultaneous operation of two different amplifiers. The first is a fast instrumentation amplifier, sensing directly the voltage drop across the tunneling barrier, the second is a medium speed current amplifier with an overall gain of 108 V/A, suitable for normal STM operation. We obtained a time resolution of 10 ns measuring the plasma ignition under a STM tip during illumination with an intense 10 ns laser pulse. Possible applications include the study of STM point contacts.</dcterms:abstract>
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    <dcterms:title>A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale</dcterms:title>
    <dc:contributor>Ochmann, Michael</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:44Z</dc:date>
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    <dcterms:bibliographicCitation>First publ. in: Review of Scientific Instruments 70 (1999), 4, pp. 2049-2052</dcterms:bibliographicCitation>
    <dc:contributor>Leiderer, Paul</dc:contributor>
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