@inproceedings{Albrecht1991resol-9066,
  year={1991},
  title={High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films},
  booktitle={Process Module Metrology, Control and Clustering, Proceedings of SPIE},
  pages={344--351},
  author={Albrecht, Uwe and Dilger, Herbert and Evers, Peter and Leiderer, Paul}
}

<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/9066">
    <dc:creator>Leiderer, Paul</dc:creator>
    <dc:contributor>Leiderer, Paul</dc:contributor>
    <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/>
    <dcterms:issued>1991</dcterms:issued>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:18Z</dc:date>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:18Z</dcterms:available>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9066/1/098_procspie_1991.pdf"/>
    <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:language>eng</dc:language>
    <dc:format>application/pdf</dc:format>
    <dc:creator>Dilger, Herbert</dc:creator>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Evers, Peter</dc:contributor>
    <dc:contributor>Dilger, Herbert</dc:contributor>
    <dc:contributor>Albrecht, Uwe</dc:contributor>
    <dcterms:title>High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films</dcterms:title>
    <dcterms:bibliographicCitation>First publ. in: Process Module Metrology, Control and Clustering, Proceedings of SPIE, Vol. 1594 (1991), pp. 344-351</dcterms:bibliographicCitation>
    <dc:creator>Albrecht, Uwe</dc:creator>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9066"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:abstract xml:lang="eng">We describe the use of optically excited surface plasmons to measure the thickness of ultrathin films deposited on gold and silver surfaces with submonolayer resolution. Additional structural information on the film is obtained by looking at the scattering of the surface plasmons. Applications of this method to physisorbed and quench-condensed molecular hydrogen films and to spreading of liquids are presented.</dcterms:abstract>
    <dc:creator>Evers, Peter</dc:creator>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9066/1/098_procspie_1991.pdf"/>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
  </rdf:Description>
</rdf:RDF>