@article{Peeters1990Angul-7416,
  year={1990},
  doi={10.1116/1.576920},
  title={Angular dependence of the secondary electron emission crystal current : effects of surface modification},
  number={2},
  volume={8},
  issn={0734-2101},
  journal={Journal of vacuum science & technology},
  pages={797--799},
  author={Peeters, Frank and Puckrin, E. R. and Slavin, Alan J.}
}

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    <dc:creator>Peeters, Frank</dc:creator>
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    <dc:creator>Slavin, Alan J.</dc:creator>
    <dc:contributor>Slavin, Alan J.</dc:contributor>
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    <dc:contributor>Puckrin, E. R.</dc:contributor>
    <dcterms:title>Angular dependence of the secondary electron emission crystal current : effects of surface modification</dcterms:title>
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    <dc:contributor>Peeters, Frank</dc:contributor>
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    <dcterms:bibliographicCitation>First publ. in: Journal of vacuum science &amp; technology 8 (1990), 2, pp. 797-799</dcterms:bibliographicCitation>
    <dc:language>eng</dc:language>
    <dcterms:issued>1990</dcterms:issued>
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    <dcterms:abstract xml:lang="eng">The variation of the angle between the incident electron beam and sample surface contributes in two ways to the secondary electron emission from single crystals. These contributions are a monotonically varying background due to the changing number ofsecondaries produced near the surface, and an oscillatory component previously explained as a bulk effect related to Kikuchi patterns. This work shows that for emission from a Au(111) surface, the background can be described well by a simple model based on the semiempirical theory of Kanaya and Kawakatsu. It also provides additional support for the explanation of the oscillations as a bulk effect by showing that the oscillation amplitude remains essentially unchanged either by surface sputtering or by the deposition of a thin lead layer. The presence of these oscillations requires some care ill the use of the secondary electron crystal current as a measure of the thickness of thin metal films.</dcterms:abstract>
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