Takane, Daichi, Souma, Seigo, Sato, Takafumi ORCID: 0000-0002-4544-5463, Takahashi, Takashi, Segawa, Kouji and Ando, Yoichi ORCID: 0000-0002-3553-3355 (2016). Work function of bulk-insulating topological insulator Bi2-xSbxTe3-ySey. Appl. Phys. Lett., 109 (9). MELVILLE: AMER INST PHYSICS. ISSN 1077-3118

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Abstract

Recent discovery of bulk insulating topological insulator (TI) Bi2-xSbxTe3-ySey paved a pathway toward practical device application of TIs. For realizing TI-based devices, it is necessary to contact TIs with a metal. Since the band-bending at the interface dominates the character of devices, knowledge of TIs' work function is of essential importance. We have determined the compositional dependence of the work function in Bi2-xSbxTe3-ySey by high-resolution photoemission spectroscopy. The obtained work-function values (4.95-5.20 eV) track the energy shift of the surface chemical potential seen by angle-resolved photoemission spectroscopy. The present result serves as a useful guide for developing TI-based electronic devices. Published by AIP Publishing.

Item Type: Journal Article
Creators:
CreatorsEmailORCIDORCID Put Code
Takane, DaichiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Souma, SeigoUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Sato, TakafumiUNSPECIFIEDorcid.org/0000-0002-4544-5463UNSPECIFIED
Takahashi, TakashiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Segawa, KoujiUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Ando, YoichiUNSPECIFIEDorcid.org/0000-0002-3553-3355UNSPECIFIED
URN: urn:nbn:de:hbz:38-266218
DOI: 10.1063/1.4961987
Journal or Publication Title: Appl. Phys. Lett.
Volume: 109
Number: 9
Date: 2016
Publisher: AMER INST PHYSICS
Place of Publication: MELVILLE
ISSN: 1077-3118
Language: English
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Faculty of Mathematics and Natural Sciences > Department of Physics > Institute of Physics II
Subjects: no entry
Uncontrolled Keywords:
KeywordsLanguage
SPIN-POLARIZED CURRENTS; ELECTRICAL DETECTION; SURFACE; BI2SE3; BI1.5SB0.5TE1.7SE1.3; BI2TE2SE; TORQUEMultiple languages
Physics, AppliedMultiple languages
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/26621

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