Single-particle evanescent light scattering simulations for total internal reflection microscopy

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Helden_0-410596.pdf
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2006
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Helden, Laurent
Eremina, Elena
Riefler, Norbert
Hertlein, Christopher
Eremin, Yuri
Wriedt, Thomas
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Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299
Zusammenfassung

We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.

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ISO 690HELDEN, Laurent, Elena EREMINA, Norbert RIEFLER, Christopher HERTLEIN, Clemens BECHINGER, Yuri EREMIN, Thomas WRIEDT, 2006. Single-particle evanescent light scattering simulations for total internal reflection microscopy. In: Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299
BibTex
@article{Helden2006-10-01Singl-39212,
  year={2006},
  doi={10.1364/AO.45.007299},
  title={Single-particle evanescent light scattering simulations for total internal reflection microscopy},
  number={28},
  volume={45},
  issn={0003-6935},
  journal={Applied Optics},
  pages={7299--7308},
  author={Helden, Laurent and Eremina, Elena and Riefler, Norbert and Hertlein, Christopher and Bechinger, Clemens and Eremin, Yuri and Wriedt, Thomas}
}
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