@inproceedings{Raabe2006Lifet-42211,
  year={2006},
  title={Lifetime monitoring and hydrogen passivation in a buried contact cell process using String Ribbon silicon},
  isbn={978-1-60423-787-0},
  publisher={WIP-Renewable Energies},
  address={Munich},
  booktitle={Twentyfirst European Photovoltaic Solar Energy Conference : Proceedings of the International Conference},
  pages={1490--1492},
  editor={Poortmans, Jozef},
  author={Raabe, Bernd and Arumughan, Jayaprasad and Clark-Phelps, Bob and Hahn, Giso},
  note={Auf CD-ROM}
}

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    <dc:contributor>Clark-Phelps, Bob</dc:contributor>
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    <dcterms:abstract xml:lang="eng">The buried contact cell design has a higher efficiency potential than the widely used screen print cell concept due to its selective emitter design and low shading losses. In industry only Cz-Si is used. Hydrogen bulk passivation and thermal load of the wafers are different in the buried contact process and can be key issues to reach high efficiencies with multi-crystalline silicon. Adjacent String Ribbon wafers are used to monitor the change of bulk lifetime during a buried contact process. Bulk lifetime was measured 2-dimensionally resolved with μ-PCD. An improvement of PECVD-SiN deposition without a firing step was measured. The heavy 10 Ohm/sq diffusion leads to a degradation due to effusion of hydrogen. Bulk lifetime after hydrogen passivation by MIRHP in a buried contact solar cell process is similar to an adjacent wafer after a screen print process, therefore higher efficiencies of buried contact cells are expected.</dcterms:abstract>
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    <dc:creator>Raabe, Bernd</dc:creator>
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    <dc:contributor>Hahn, Giso</dc:contributor>
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