Detailed analysis of high sheet resistance emitters for selectively doped silicon solar cells

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2009
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Proceedings of the 24th European PV SEC, Hamburg, 21. - 25. September 2009. München: WIP, 2009, pp. 1719-1722. ISBN 3-936338-25-6. Available under: doi: 10.4229/24thEUPVSEC2009-2CV.5.3
Zusammenfassung

A selective emitter structure is a promising approach to improve the cell efficiency of industrial type silicon solar cells by minimizing the losses at the front surface and in the emitter. Selective emitters can be produced by numerous processing sequences, resulting in different doping profiles. This work focuses on evaluating the potential of the high sheet resistance emitters that are created by the selective emitter processes developed at the University of Konstanz (UKN). In these processes, the high sheet resistance emitter is created by a heavy diffusion and an etchback of the heavily doped surface layer [1, 2], or by a weak diffusion with a subsequent drive-in step [4, 5]. QSSPC samples were fabricated to evaluate the emitter quality by measuring the emitter saturation current j0E. On some emitter profiles, SIMS measurements were performed. For the etchback emitter a strong improvement in j0E can be achieved by etching back a heavily doped emitter, resulting in a highest cell efficiency of 18.9%. For the drive-in emitter we have shown that the masking SiNX layer should be removed and redeposited after drive-in in order to obtain a good hydrogen passivation and a low emitter saturation current.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Selective Emitter, Etching, Porous Silicon
Konferenz
24th European Photovoltaic Solar Energy Conference, 21. Sept. 2009 - 25. Sept. 2009, Hamburg
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Zitieren
ISO 690BOOK, Felix, Amir DASTGHEIB-SHIRAZI, Bernd RAABE, Helge HAVERKAMP, Giso HAHN, Peter GRABITZ, 2009. Detailed analysis of high sheet resistance emitters for selectively doped silicon solar cells. 24th European Photovoltaic Solar Energy Conference. Hamburg, 21. Sept. 2009 - 25. Sept. 2009. In: Proceedings of the 24th European PV SEC, Hamburg, 21. - 25. September 2009. München: WIP, 2009, pp. 1719-1722. ISBN 3-936338-25-6. Available under: doi: 10.4229/24thEUPVSEC2009-2CV.5.3
BibTex
@inproceedings{Book2009Detai-851,
  year={2009},
  doi={10.4229/24thEUPVSEC2009-2CV.5.3},
  title={Detailed analysis of high sheet resistance emitters for selectively doped silicon solar cells},
  isbn={3-936338-25-6},
  publisher={WIP},
  address={München},
  booktitle={Proceedings of the 24th European PV SEC, Hamburg, 21. - 25. September 2009},
  pages={1719--1722},
  author={Book, Felix and Dastgheib-Shirazi, Amir and Raabe, Bernd and Haverkamp, Helge and Hahn, Giso and Grabitz, Peter}
}
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