Microwave study of surface electrons on helium films in a magnetic field

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225_jlowtempph_1998.pdf
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1998
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Mistura, Giampaolo
Tress, Oliver
Teske, Ekkehard
Shikin, Valeri
Wyder, Peter
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Journal of Low Temperature Physics. 1998, 110(1-2), pp. 243-248. Available under: doi: 10.1023/A:1022512128114
Zusammenfassung

We report preliminary results of a cyclotron resonance study of surface electrons (SE) on saturated helium films covering a PMMA substrate at T > 1 K. The real and imaginary parts of the dielectric response e(K,w) of the SE are measured at fixed k and w in B-fields up to 10 T in a 12 GHz cavity. The cyclotron resonance of the SE is determined at different helium film thicknesses dHe and at various electron densities. At small dHe we find significant anomalies in the cyclotron resonance lineshape and position. As dfje increases the lineshape becomes progressively more symmetric and its peak moves towards the cyclotron field value expected for a free electron. To fit these data we have modified the classical Drude expression, introducing two different relaxation times for the low and high B-field regions. The phenomenological formulas fit the data quite well. A systematic theoretical analysis of these results is in progress.

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ISO 690MISTURA, Giampaolo, Oliver TRESS, Ekkehard TESKE, Valeri SHIKIN, Peter WYDER, Paul LEIDERER, 1998. Microwave study of surface electrons on helium films in a magnetic field. In: Journal of Low Temperature Physics. 1998, 110(1-2), pp. 243-248. Available under: doi: 10.1023/A:1022512128114
BibTex
@article{Mistura1998Micro-8970,
  year={1998},
  doi={10.1023/A:1022512128114},
  title={Microwave study of surface electrons on helium films in a magnetic field},
  number={1-2},
  volume={110},
  journal={Journal of Low Temperature Physics},
  pages={243--248},
  author={Mistura, Giampaolo and Tress, Oliver and Teske, Ekkehard and Shikin, Valeri and Wyder, Peter and Leiderer, Paul}
}
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