Efficient ultraviolet electroluminescence from a Gd-implanted silicon metal oxide semiconductor device

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2004
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Sun, Jiaming
Skorupa, Wolfgang
Helm, Manfred
Rebohle, Lars
Gebel, Thoralf
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Applied Physics Letters. 2004, 85(16), pp. 3387-3389. Available under: doi: 10.1063/1.1808488
Zusammenfassung

Strong ultraviolet electroluminescence with an external quantum efficiency above 1% is observed from an indium-tin oxide/SiO2:Gd/Si metal oxide semiconductor structure. The SiO2:Gd active layer is prepared by thermal oxidation followed by Gd+ implantation and annealing. The electroluminescence spectra show a sharp peak at 316 nm from the 6P 7/2 to 8S 7/2 transition of Gd3+ ions. Micrometer-sized electroluminescent devices are demonstrated.

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ISO 690SUN, Jiaming, Wolfgang SKORUPA, Thomas DEKORSY, Manfred HELM, Lars REBOHLE, Thoralf GEBEL, 2004. Efficient ultraviolet electroluminescence from a Gd-implanted silicon metal oxide semiconductor device. In: Applied Physics Letters. 2004, 85(16), pp. 3387-3389. Available under: doi: 10.1063/1.1808488
BibTex
@article{Sun2004Effic-4833,
  year={2004},
  doi={10.1063/1.1808488},
  title={Efficient ultraviolet electroluminescence from a Gd-implanted silicon metal oxide semiconductor device},
  number={16},
  volume={85},
  journal={Applied Physics Letters},
  pages={3387--3389},
  author={Sun, Jiaming and Skorupa, Wolfgang and Dekorsy, Thomas and Helm, Manfred and Rebohle, Lars and Gebel, Thoralf}
}
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