Rare earth ion implantation for silicon based light emission : from infrared to ultraviolet

Lade...
Vorschaubild
Dateien
Datum
2005
Autor:innen
Skorupa, Wolfgang
Sun, Jiaming
Prucnal, Slawomir
Rebohle, Lars
Gebel, Thoralf
Nazarov, Alexei N.
Osiyuk, Igor N.
Helm, Manfred
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
DOI (zitierfähiger Link)
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Open Access Green
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Publikationstyp
Beitrag zu einem Konferenzband
Publikationsstatus
Published
Erschienen in
Materials Research Society Symposium V. 2005
Zusammenfassung

Using ion implantation different rare earth luminescent centers (Gd3+, Tb3+, Eu3+, Ce3+, Tm3+, Er3+) were created into the silicon dioxide layer of a purpose-designed Metal Oxide Silicon (MOS) capacitor with advanced electrical performance, further called a MOS-light emitting device (MOSLED). The silicon dioxide layer did not contain silicon nanoclusters. Efficient electroluminescence was obtained from UV to infrared with a transparent top electrode made of indium-tin oxide. The electroluminescence properties were studied with respect to the luminescence spectra, decay time, impact excitation, cross relaxation (Tb3+), and power efficiency. Top values of the efficiency of 0.3 % corresponding to external quantum efficiencies well above the percent range were reached. The electrical properties of these devices such as current-voltage and charge trapping characteristics, were also evaluated. Moreover, we demonstrate photo- and electroluminescence in correlation to charge trapping characteristics for Er-rich MOSLEDs with a varying silicon cluster content. Finally, application aspects to the field of biosensing will be discussed.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Konferenz
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690SKORUPA, Wolfgang, Jiaming SUN, Slawomir PRUCNAL, Lars REBOHLE, Thoralf GEBEL, Alexei N. NAZAROV, Igor N. OSIYUK, Thomas DEKORSY, Manfred HELM, 2005. Rare earth ion implantation for silicon based light emission : from infrared to ultraviolet. In: Materials Research Society Symposium V. 2005
BibTex
@inproceedings{Skorupa2005earth-9345,
  year={2005},
  title={Rare earth ion implantation for silicon based light emission : from infrared to ultraviolet},
  booktitle={Materials Research Society Symposium V},
  author={Skorupa, Wolfgang and Sun, Jiaming and Prucnal, Slawomir and Rebohle, Lars and Gebel, Thoralf and Nazarov, Alexei N. and Osiyuk, Igor N. and Dekorsy, Thomas and Helm, Manfred}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/9345">
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9345/1/Rare_earth_ion_implantation_for_silicon_based_light_emission.pdf"/>
    <dc:creator>Dekorsy, Thomas</dc:creator>
    <dcterms:bibliographicCitation>First publ. in: Materials Research Society Symposium V, 866 (2005)</dcterms:bibliographicCitation>
    <dc:creator>Sun, Jiaming</dc:creator>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:55:43Z</dcterms:available>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9345/1/Rare_earth_ion_implantation_for_silicon_based_light_emission.pdf"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:55:43Z</dc:date>
    <dc:language>eng</dc:language>
    <dc:creator>Helm, Manfred</dc:creator>
    <dc:format>application/pdf</dc:format>
    <dc:creator>Rebohle, Lars</dc:creator>
    <dc:contributor>Prucnal, Slawomir</dc:contributor>
    <dc:creator>Nazarov, Alexei N.</dc:creator>
    <dcterms:title>Rare earth ion implantation for silicon based light emission : from infrared to ultraviolet</dcterms:title>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:creator>Prucnal, Slawomir</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights>
    <dc:contributor>Osiyuk, Igor N.</dc:contributor>
    <dc:contributor>Dekorsy, Thomas</dc:contributor>
    <dcterms:issued>2005</dcterms:issued>
    <dc:contributor>Nazarov, Alexei N.</dc:contributor>
    <dc:contributor>Rebohle, Lars</dc:contributor>
    <dcterms:abstract xml:lang="eng">Using ion implantation different rare earth luminescent centers (Gd3+, Tb3+, Eu3+, Ce3+, Tm3+, Er3+) were created into the silicon dioxide layer of a purpose-designed Metal Oxide Silicon (MOS) capacitor with advanced electrical performance, further called a MOS-light emitting device (MOSLED). The silicon dioxide layer did not contain silicon nanoclusters. Efficient electroluminescence was obtained from UV to infrared with a transparent top electrode made of indium-tin oxide. The electroluminescence properties were studied with respect to the luminescence spectra, decay time, impact excitation, cross relaxation (Tb3+), and power efficiency. Top values of the efficiency of 0.3 % corresponding to external quantum efficiencies well above the percent range were reached. The electrical properties of these devices such as current-voltage and charge trapping characteristics, were also evaluated. Moreover, we demonstrate photo- and electroluminescence in correlation to charge trapping characteristics for Er-rich MOSLEDs with a varying silicon cluster content. Finally, application aspects to the field of biosensing will be discussed.</dcterms:abstract>
    <dc:creator>Osiyuk, Igor N.</dc:creator>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9345"/>
    <dc:contributor>Skorupa, Wolfgang</dc:contributor>
    <dc:creator>Gebel, Thoralf</dc:creator>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Sun, Jiaming</dc:contributor>
    <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/>
    <dc:contributor>Helm, Manfred</dc:contributor>
    <dc:creator>Skorupa, Wolfgang</dc:creator>
    <dc:contributor>Gebel, Thoralf</dc:contributor>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen