Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope
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Applied Physics Letters. 2008, 92, 251103. Available under: doi: 10.1063/1.2949858
Zusammenfassung
Apertureless near field measurements with a metallic tip are performed in the terahertz frequency range. Lateral scans are recorded for different time delays within a terahertz pulse. The forward scattered terahertz signal strongly depends on the time delay. At larger time delays, the tip-sample interaction leads to additional structures in the scan that do not correspond to a change in topography or dielectric function.
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THOMA, Arne, Thomas DEKORSY, 2008. Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope. In: Applied Physics Letters. 2008, 92, 251103. Available under: doi: 10.1063/1.2949858BibTex
@article{Thoma2008Influ-9470, year={2008}, doi={10.1063/1.2949858}, title={Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope}, volume={92}, journal={Applied Physics Letters}, author={Thoma, Arne and Dekorsy, Thomas}, note={Article Number: 251103} }
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